Jointly super-resolved and optically sectioned Bayesian reconstruction method for structured illumination microscopy
Structured Illumination Microscopy (SIM) is an imaging technique for achieving both super-resolution (SR) and optical sectioning (OS) in wide-field microscopy. It consists in illuminating the sample with periodic patterns at different orientations and positions. The resulting images are then processed to reconstruct the observed object with SR and
Yann Lai-Tim et al.
Fecha de publicación:
11
2019