The Euclid mission - with its spectroscopic galaxy survey covering a sky area over 15 000 deg 2 in the redshift range 0.9 < z < 1.8 - will provide a sample of tens of thousands of cosmic voids. This paper thoroughly explores for the first time the constraining power of the void size function on the properties of dark energy (DE) from a survey mock

Context. Activity on the far side of the Sun is routinely studied through the analysis of the seismic oscillations detected on the near side using helioseismic techniques such as phase-shift sensitive holography. Detections made through those methods are limited to strong active regions due to the need for a high signal-to-noise ratio. Recently

We release the first grid of stellar limb-darkening coefficients (LDCs) and intensity profiles (IPs) computed by the consortium of the PLAnetary Transits and Oscillations of stars (PLATO), the next medium-class (M3) mission under development by the European Space Agency to be launched in 2026. We have performed spectral synthesis with TurboSpectrum

Context. Gaia-CRF3 is the celestial reference frame for positions and proper motions in the third release of data from the Gaia mission, Gaia DR3 (and for the early third release, Gaia EDR3, which contains identical astrometric results). The reference frame is defined by the positions and proper motions at epoch 2016.0 for a specific set of

Context. Anti-solar differential rotation profiles have been found for decades in numerical simulations of convective envelopes of solar-type stars. These profiles are characterized by a slow equator and fast poles (i.e., reversed with respect to the Sun) and have been found in simulations for high Rossby numbers. Rotation profiles like this have

Thin and thick disks are found in most spiral galaxies, yet their formation scenarios remain uncertain. Whether thick disks form through slow or fast, internal or environmental, processes is unclear. The physical origin of outer truncations in thin and thick disks, observed as a drop in optical and near-infrared (NIR) surface brightness profiles