About LISA MWIR Range (MCT) 0.9 - 2.5 microns:

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Typical tests available at LISA with MWIR range devices:

Standard parameters (all applied to VIS CMOS devices and...)

• MWIR (900 -2500 nm): MCT (HgCdTe) and InSb detector modules.
  • Noise measurement
  • DC measurement
  • Quantum Efficiency
  • Linearity
  • Power
  • Temperature dependences
  • Persistence
  • Reset effects
  • Glowing
  • Noise reduction strategies (Simple, CDS, Fowler, Ramps and mixed)

A tentative list of MWIR devices tested and characterized at the LISA facility is given below:

• From Cincinnati Electronics: small (256 x 256) InSb arrays (up to 5000nm)
• From Rockwell: small NICMOS (256 x 256) and PICNIC MCT arrays (up to 2500nm); HAWAII-1K MCT array; HAWAII-2K PACE arrays (up to 2500nm) (With ARc-32-channel gen III control electronics)
• From Teledyne (formerly Rockwell): H2RG (2k x 2k) arrays. Including SIDECAR/ASIC control electronics and several interfacing cards (JADE & SAM -from Teledyne-) and MACIE (from Markury Scientific)